Showing results: 31 - 45 of 68 items found.
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W-IE-NE-R, Plein & Baus GmbH
WIENER VME load boards are designed to test VME crate power supplies and fan trays by drawing power from the VME backplane and dissipating it as heat. A series of switches on the module front panel allows for easy adjustment of the current draw for each voltage channel.
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PXP-100B -
Teledyne LeCroy
The Teledyne LeCroy PXP-100B Test Platform provides a convenient means for testing PCIe 2.0 add-in cards with a self-contained portable and powered passive backplane. The PXP-100B provides power required for both cards under test, and an interposer can be used for connection to a protocol analyzer. As an alternative to an interposer, the PXP-100B includes two mid-bus probe footprints to allow connection to an analyzer via a mid-bus probe.
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784782-01 -
NI
PXIe, 9-Slot (8 Hybrid Slots), Up to 8 GB/s PXI Chassis - The PXIe-1088 features an all-hybrid backplane to meet a wide range of high-performance test and measurement application needs. The hybrid connector type in every peripheral slot enables the most flexibility in terms of instrumentation module placement.
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784058-01 -
NI
PXIe, 18-Slot (17 Hybrid Slots), Up to 4 GB/s PXI Chassis—The PXIe-1084 features an all-hybrid backplane to meet a wide range of high-performance test and measurement application needs. The hybrid connector type in every peripheral slot enables the most flexibility in terms of instrumentation module placement.
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787026-01 -
NI
PXIe, 5-Slot (5 Hybrid Slots), Up to 2 GB/s PXI Chassis - The PXIe‑1083 features a high-bandwidth, all-hybrid backplane to meet high-performance test and measurement application needs. This PXI chassis features all hybrid connectors, 58 W power and cooling, and an integrated … Thunderbolt 3 MXI-Express controller.
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781622-01 -
NI
PXIe, 9-Slot, Up to 1.75 GB/s PXI Chassis—The PXIe‑1078 features a backplane that incorporates a PCI Express connection to every slot to meet a wide range of test and measurement application needs. It accepts PXI Express modules in every slot and supports standard PXI hybrid-compatible modules in up to five slots.
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Keysight Technologies
When you need to measure advanced S-parameters with a fast, low-cost and easy-to-use test solution, the Digital Interconnect Test System gives you a significant edge. It provides a full 32-port vector network analyzer (VNA) configured within a single PXI chassis – ideal for high-speed cable testing. And lets you test any linear passive interconnect faster and easier, including backplanes, connectors and PCBs. Sharpen your edge with Keysight’s Digital Interconnect Test System that enables signal integrity characterization of multiport interconnect products.
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51-921A-001 -
Pickering Interfaces Ltd.
The use of the StarFabric interface operating at 2.5Gb/s minimizes the impact on system speed. The PCI interface of the 51-921A supports both 32 bit and 64 bit operation and backplane speeds of 33MHz and 66MHz, ensuring the highest speed operation under all conditions. The StarFabric interface ensures the modules perform seamlessly with no impact on the test system software.
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783588-01 -
NI
PXIe, 18-Slot (16 Hybrid Slots, 1 PXIe Timing Slot), Up to 24 GB/s PXI Chassis—The PXIe‑1085 features a high-bandwidth, all-hybrid backplane to meet a wide range of high-performance test and measurement application needs. The hybrid connector type in every peripheral slot enables the most flexibility in terms of instrumentation module placement.
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781813-01 -
NI
PXIe, 18-Slot (16 Hybrid Slots, 1 PXIe Timing Slot), Up to 24 GB/s PXI Chassis—The PXIe‑1085 features a high-bandwidth, all-hybrid backplane to meet a wide range of high-performance test and measurement application needs. The hybrid connector type in every peripheral slot enables the most flexibility in terms of instrumentation module placement.
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780321-01 -
NI
PXIe, 8-Slot, Up to 8 GB/s PXI Chassis—The PXIe‑1082 features a high-bandwidth backplane to meet a wide range of high-performance test and measurement application needs. It accepts PXI Express modules in every slot and supports standard PXI hybrid-compatible modules in up to four slots. The chassis features an extended operating temperature range for applications needing cooling performance.
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786397-01 -
NI
PXIe, 18-Slot (17 Hybrid Slots), Up to 4 GB/s PXI Chassis - The PXIe-1084 features an all-hybrid backplane to meet a wide range of high-performance test and measurement application needs. It also offers a Timing and Synchronization option that includes external clock and trigger routing. The hybrid connector type in every peripheral slot enables the most flexibility in terms of instrumentation module placement.
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779633-01 -
NI
8-Slot, Quiet, Up to 3 GB/s PXI Chassis—The PXIe‑1062Q is designed for a wide range of test and measurement applications and provides a high-bandwidth backplane. The NI PXIe‑1062Q has four PXI peripheral slots, one PXI Express slot with system timing capabilities, and two PXI Express hybrid slots that accept both PXI and PXI Express peripheral modules.
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NI
Signal Generator Adapter Modules for FlexRIO feature either high or low‐speed analog output and can be paired with a PXI FPGA Module for FlexRIO or the Controller for FlexRIO for custom signal generation. Whether you need to dynamically generate waveforms on the FPGA or stream them across the PXI backplane, these adapter modules are well suited for applications in communications, hardware‐in‐the‐loop (HIL) test, and scientific instrumentation.
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603d -
Testronics Inc.
A major problem in the backplane industry is detecting bent connector pin defects. The most difficult being when the pin bends underneath the shroud rather than going into the hole. Many times this defect cannot be detected electrically as the connector pin is touching the conductive annular ring of the hole, allowing electrical test to pass. Unfortunately, it is an intermittent connection and will fail later on as there is not an actual mechanical connection.